MeaSSUre:I-V: Open software for transistor characterization using source-meter units
Despite the importance of transistors in modern electronics, transistor characterization requires expensive instruments that are not affordable for many researchers, engineers and educators. Here, we present software that can control source-meter units (SMUs) for current–voltage (I–V) characterizati...
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| Главные авторы: | , , |
|---|---|
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Elsevier
2023-02-01
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| Серии: | SoftwareX |
| Предметы: | |
| Online-ссылка: | http://www.sciencedirect.com/science/article/pii/S2352711023000146 |
| Метки: |
Нет меток, Требуется 1-ая метка записи!
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