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myDLTS: LabVIEW based software for deep level transient spectroscopy using impedance analyser

Deep Level Transient Spectroscopy (DLTS) is a technique used to identify and characterize deep defects in materials. New kind of setups using impedance analysers are developed over capacitance bridges. The impedance analyser from Zurich Instruments MFIA has gained significant interest due to its ver...

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Principais autores: Adrian Kaim, Katarzyna Gwóźdź
Format: Artigo
Sprog:Inglês
Udgivet: Elsevier 2024-05-01
Serier:SoftwareX
Fag:
DLTS
LabVIEW
Defects
Rectifying junctions
Software, MFIA
Online adgang:http://www.sciencedirect.com/science/article/pii/S2352711024000505
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