The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities

How materials evolve at thermal equilibrium and under external excitations at small length and time scales is crucial to the understanding and control of material properties. X-ray photon correlation spectroscopy (XPCS) at X-ray free electron laser (XFEL) facilities can in principle capture dynamics...

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Detaylı Bibliyografya
Asıl Yazarlar:	Yue Cao, Dina Sheyfer, Zhang Jiang, Siddharth Maddali, Hoydoo You, Bi-Xia Wang, Zuo-Guang Ye, Eric M. Dufresne, Hua Zhou, G. Brian Stephenson, Stephan O. Hruszkewycz
Materyal Türü:	Artigo
Dil:	Inglês
Baskı/Yayın Bilgisi:	MDPI AG 2020-12-01
Seri Bilgileri:	Crystals
Konular:	X-ray photon correlation spectroscopy X-ray free electron laser speckle visibility X-ray intensity fluctuations
Online Erişim:	https://www.mdpi.com/2073-4352/10/12/1109
Etiketler:	Etiketle Etiket eklenmemiş, İlk siz ekleyin!

The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities

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