Effect of Ru Interlayer thickness on Electrophysical Properties of Co/Ru/Co three-layer film systems

In this paper, the investigation of the crystal structure and electrophysical properties of Co/Ru/Co/Sub three-layer film systems with a Ru layer thickness dRu = 5-20 nm has been carried out. It is shown that for both as-deposited and annealed at 800 K thin-film samples the phase composition corresp...

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Detalhes bibliográficos

Principais autores:	A.M. Lohvynov, I.V. Cheshko, I.M. Pazukha, K.V. Tyschenko, O.V. Pylypenko, A.Yu. Zahorulko
Formato:	Artigo
Idioma:	Inglês
Publicado em:	Vasyl Stefanyk Carpathian National University 2022-09-01
coleção:	Фізика і хімія твердого тіла
Assuntos:	three-layer film systems layer-by-layer condensation electrophysical properties resistivity temperature coefficient of resistance
Acesso em linha:	https://journals.pnu.edu.ua/index.php/pcss/article/view/5730
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