Optical and Electrochromic Properties of E-Beam Evaporated Nickel Oxide Thin Film
Nickel oxide (NiO) thin films were deposited by e-beam evaporation on glass and ITO coated glass substrates initially held at room temperature without post-heat treatments. The structural and optical properties were investigated using glancing incident X-ray diffractometer (GIXRD) and spectrophotome...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Sumy State University
2011-01-01
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| Edice: | Журнал нано- та електронної фізики |
| Témata: | |
| On-line přístup: | http://jnep.sumdu.edu.ua/download/numbers/2011/1,%20Part%202/articles/jnep_2011_V3_N1(Part2)_362-369.pdf |
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