Combined Thickness and Permittivity Measurement of Thin Layers with Open-Ended Coaxial Probes
This paper presents a method to simultaneously determine the thickness and permittivity of thin layers from multi-frequency reflection coefficient measurements using an open-ended coaxial probe. This is achieved by exploiting that the probe becomes radiating at frequencies higher than the probe̵...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI AG
2019-04-01
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| Edice: | Sensors |
| Témata: | |
| On-line přístup: | https://www.mdpi.com/1424-8220/19/8/1765 |
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