A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy

Interfaces such as grain boundaries (GBs) and heterointerfaces (HIs) are known to play a crucial role in structure-property relationships of polycrystalline materials. While several methods have been used to characterize such interfaces, advanced transmission electron microscopy (TEM) and scanning T...

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Autors principals:	Hasti Vahidi, Komal Syed, Huiming Guo, Xin Wang, Jenna Laurice Wardini, Jenny Martinez, William John Bowman
Format:	Artigo
Idioma:	Inglês
Publicat:	MDPI AG 2021-07-01
Col·lecció:	Crystals
Matèries:	oxides ceramics polycrystalline grain boundary heterointerface transmission electron microscopy
Accés en línia:	https://www.mdpi.com/2073-4352/11/8/878
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