Código QR (código de barras bidimensional)

Test Scheduling and Test Time Minimization of System-on-Chip Using Modified BAT Algorithm

System-on-Chip (SoC) is a structure in which semiconductor components are integrated into a single die. As a result, testing time should be reduced to achieve a low cost for each chip. Effective test scheduling can reduce the SoC testing time, which is more challenging due to its complexity. In this...

Fuld beskrivelse

Na minha lista:
Principais autores: Gokul Chandrasekaran, Neelam Sanjeev Kumar, P. R. Karthikeyan, K. Vanchinathan, Neeraj Priyadarshi, Bhekisipho Twala
Format: Artigo
Sprog:Inglês
Udgivet: IEEE 2022-01-01
Serier:IEEE Access
Fag:
Test time
system-on-chip
modified BAT algorithm
BAT algorithm
test scheduling
Online adgang:https://ieeexplore.ieee.org/document/9964215/
Tags: Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!

Lignende værker