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Concept graph embedding models for enhanced accuracy and interpretability

In fields requiring high accountability, it is necessary to understand how deep-learning models make decisions when analyzing the causes of image classification. Concept-based interpretation methods have recently been introduced to reveal the internal mechanisms of deep learning models using high-le...

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Autors principals: Sangwon Kim, Byoung Chul Ko
Format: Artigo
Idioma:Inglês
Publicat: IOP Publishing 2024-01-01
Col·lecció:Machine Learning: Science and Technology
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Accés en línia:https://doi.org/10.1088/2632-2153/ad6ad2
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