Exploring Structural Changes in Ge-Te Amorphous Films Through Small-Angle Neutron Scattering
The structure of the glassy Ge<sub><i>x</i></sub>Te<sub>1−<i>x</i></sub> system, with <i>x</i> = 0.17, 0.21, 0.28, 0.30, and 0.45, is studied using the small-angle neutron scattering (SANS) technique. The very-low-momentum-transfer region of the diffractogram exhibits distinct behaviour depending on...
Guardado en:
| Autores principales: | , , , , |
|---|---|
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
MDPI AG
2024-12-01
|
| Colección: | Applied Sciences |
| Materias: | |
| Acceso en línea: | https://www.mdpi.com/2076-3417/14/24/11713 |
| Etiquetas: |
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
