铝质电瓷的断口显微观察研究
用断口显微观察的方法,研究了电瓷材料.Al<sub>2</sub>O<sub>3</sub>含量低的挤制法瓷料,典型的强度控制性缺陷是石英晶粒;Al<sub>2</sub>O<sub>3</sub>含量高的等静压法瓷料,典型的强度控制性缺陷为气孔.测得的断裂镜面常数为1.0MN/m<sup>3/2</sup>.等静压瓷料的残余应力约90MPa.
I tiakina i:
| Kaituhi matua: | |
|---|---|
| Hōputu: | Artigo |
| Reo: | Chinês |
| I whakaputaina: |
Editorial Department of Insulators and Surge Arresters
1989-01-01
|
| Rangatū: | Dianci bileiqi |
| Urunga tuihono: | http://www.dcblq.com/thesisDetails#10.16188/j.isa.1003-8337.1989.03.008 |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
|