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Monte Carlo Simulation-Based Method for Evaluating Sample Thickness Variation to Improve Reliability of Dielectric Strength Assessment

This study investigated the thickness effect (the influence of sample thickness variation) on the assessment of the dielectric breakdown strength in XLPE and PP insulators. A Monte Carlo simulation (MCS) was conducted to quantify the impact of voltage and thickness on the dielectric strength. Aimed...

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Principais autores: Keon-Hee Park, Seung-Won Lee, Hae-Jong Kim, Jang-Seob Lim
פורמט: Artigo
שפה:Inglês
יצא לאור: IEEE 2025-01-01
סדרה:IEEE Access
נושאים:
Breakdown strength
Monte Carlo simulation
reliability
thickness effect
גישה מקוונת:https://ieeexplore.ieee.org/document/11053799/
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