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Analysis Strategies for MHz XPCS at the European XFEL

The nanometer length-scale holds precious information on several dynamical processes that develop from picoseconds to seconds. In the past decades, X-ray scattering techniques have been developed to probe the dynamics at such length-scales on either ultrafast (sub-nanosecond) or slow ((milli-)second...

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Detalles Bibliográficos
Principais autores: Francesco Dallari, Mario Reiser, Irina Lokteva, Avni Jain, Johannes Möller, Markus Scholz, Anders Madsen, Gerhard Grübel, Fivos Perakis, Felix Lehmkühler
Formato: Artigo
Idioma:Inglês
Publicado: MDPI AG 2021-08-01
Series:Applied Sciences
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Acceso en liña:https://www.mdpi.com/2076-3417/11/17/8037
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