Analysis Strategies for MHz XPCS at the European XFEL
The nanometer length-scale holds precious information on several dynamical processes that develop from picoseconds to seconds. In the past decades, X-ray scattering techniques have been developed to probe the dynamics at such length-scales on either ultrafast (sub-nanosecond) or slow ((milli-)second...
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| Principais autores: | , , , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
MDPI AG
2021-08-01
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| Series: | Applied Sciences |
| Assuntos: | |
| Acceso en liña: | https://www.mdpi.com/2076-3417/11/17/8037 |
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