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Characterization of molecular diversity and genome-wide mapping of loci associated with resistance to stripe rust and stem rust in Ethiopian bread wheat accessions

Abstract Background The narrow genetic basis of resistance in modern wheat cultivars and the strong selection response of pathogen populations have been responsible for periodic and devastating epidemics of the wheat rust diseases. Characterizing new sources of resistance and incorporating multiple...

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Autors principals: Kebede T. Muleta, Matthew N. Rouse, Sheri Rynearson, Xianming Chen, Bedada G. Buta, Michael O. Pumphrey
Format: Artigo
Idioma:Inglês
Publicat: BMC 2017-08-01
Col·lecció:BMC Plant Biology
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Accés en línia:http://link.springer.com/article/10.1186/s12870-017-1082-7
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