Deflected beam method for absolute current density determination
We present a broadly applicable in situ method for profiling ion beams using electrostatic deflectors and a Faraday cup. By deconvolving the detector geometry from the resulting current profiles, spatially resolved absolute current density profiles are obtained. We demonstrate this method’s efficacy...
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| Główni autorzy: | , , , , |
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| Format: | Artigo |
| Język: | Inglês |
| Wydane: |
AIP Publishing LLC
2023-05-01
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| Seria: | AIP Advances |
| Dostęp online: | http://dx.doi.org/10.1063/5.0144879 |
| Etykiety: |
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