Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys
Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for materi...
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| Principais autores: | , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI AG
2018-06-01
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| coleção: | Quantum Beam Science |
| Assuntos: | |
| Acesso em linha: | http://www.mdpi.com/2412-382X/2/2/13 |
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