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Study on the Technology Trend Screening Framework Using Unsupervised Learning

Outliers that deviate from a normal distribution are typically removed during the analysis process. However, the patterns of outliers are recognized as important information in the outlier detection method. This study proposes a technology trend screening framework based on a machine learning algori...

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Principais autores: Junseok Lee, Sangsung Park, Juhyun Lee
פורמט: Artigo
שפה:Inglês
יצא לאור: MDPI AG 2022-09-01
סדרה:Applied Sciences
נושאים:
patent analysis
drone
Doc2Vec
topic model
outlier
גישה מקוונת:https://www.mdpi.com/2076-3417/12/17/8920
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