An Improved YOLOv11 for Tiny Surface Defect Detection on Electrical Commutators

Aiming at the challenges of class imbalance, tiny defect scales, and complex brushed background interference in the surface defect detection of electrical commutators, this paper proposes a high-precision and lightweight improved instance segmentation algorithm named WG-YOLOv11. Firstly, to overcome...

Description complète

Détails bibliographiques

Auteurs principaux:	Jichen Yuan, Zepeng Su, Zhulin Liu
Format:	Artigo
Langue:	Inglês
Publié:	MDPI AG 2026-05-01
Collection:	Algorithms
Sujets:	industrial surface defect detection instance segmentation YOLOv11 wavelet convolution group attention mechanism α-IoU loss function
Accès en ligne:	https://www.mdpi.com/1999-4893/19/5/422
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!