High-repetition-rate ultrafast electron diffraction with direct electron detection
Ultrafast electron diffraction (UED) instruments typically operate at kHz or lower repetition rates and rely on indirect detection of electrons. However, these experiments encounter limitations because they are required to use electron beams containing a relatively large number of electrons (≫100 el...
保存先:
| 主要な著者: | , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
AIP Publishing LLC and ACA
2024-09-01
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| シリーズ: | Structural Dynamics |
| オンライン･アクセス: | http://dx.doi.org/10.1063/4.0000256 |
| タグ: |
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