Monte Carlo simulation of reliability of electronic components of very large-scale integrated circuits
Objective. Development of a methodology for assessing the reliability of electronic components of very large-scale integrated circuits using stochastic modeling by the Monte Carlo method for failure prediction and reliability parameter optimization.Method. The Monte Carlo statistical testing method...
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| Hoofdauteurs: | , |
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| Formaat: | Artigo |
| Taal: | Russo |
| Gepubliceerd in: |
Dagestan State Technical University
2025-11-01
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| Reeks: | Вестник Дагестанского государственного технического университета: Технические науки |
| Onderwerpen: | |
| Online toegang: | https://vestnik.dgtu.ru/jour/article/view/1838 |
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