Optically Active Defect Engineering via Plasma Treatment in a MIS‐Type 2D Heterostructure

Abstract At the interface of 2D heterostructures, the presence of defects and their manipulation play a crucial role in the interfacial charge transfer behavior, further influencing the device functionality and performance. In this study, the impact of deliberately introduced photo‐active defects in...

Ausführliche Beschreibung

Bibliografische Detailangaben

Hauptverfasser:	Yingjie Tao, Ran Tian, Jiayuan Zhou, Kui Chu, Xuegang Chen, Wenshuai Gao, Guopeng Wang, Yuxuan Jiang, Kenji Watanabe, Takashi Taniguchi, Mingliang Tian, Xue Liu
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	Wiley-VCH 2024-10-01
Schriftenreihe:	Advanced Materials Interfaces
Schlagworte:	defect engineering ICP treatment MIS‐type vdW heterostructure photodetector
Online-Zugang:	https://doi.org/10.1002/admi.202400288
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