X-ray diffraction with micrometre spatial resolution for highly absorbing samples
X-ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materia...
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| Principais autores: | , , , , , , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2022-11-01
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| coleção: | Journal of Synchrotron Radiation |
| Assuntos: | |
| Acesso em linha: | http://scripts.iucr.org/cgi-bin/paper?S1600577522008025 |
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