Training Deep Neural Networks to Reconstruct Nanoporous Structures From FIB Tomography Images Using Synthetic Training Data

Focused ion beam (FIB) tomography is a destructive technique used to collect three-dimensional (3D) structural information at a resolution of a few nanometers. For FIB tomography, a material sample is degraded by layer-wise milling. After each layer, the current surface is imaged by a scanning elect...

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Główni autorzy:	Trushal Sardhara , Roland C. Aydin , Yong Li , Nicolas Piché , Raynald Gauvin , Christian J. Cyron , Martin Ritter
Format:	Artigo
Język:	Inglês
Wydane:	Frontiers Media S.A. 2022-02-01
Seria:	Frontiers in Materials
Hasła przedmiotowe:	electron microscopy synthetic training data 3D reconstruction semantic segmentation SEM simulation 3D CNN
Dostęp online:	https://www.frontiersin.org/articles/10.3389/fmats.2022.837006/full
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