Gate-reflectometry dispersive readout and coherent control of a spin qubit in silicon
Gate-reflectometry is a recently demonstrated measurement technique for single spin states in silicon. It is potentially able to perform quantum non-demolition measurements and uses compact circuitry that can be scaled up to larger quantum computers. Crippa et al. successfully combine gate-reflectom...
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| Principais autores: | , , , , , , , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Portfolio
2019-07-01
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| coleção: | Nature Communications |
| Acesso em linha: | https://doi.org/10.1038/s41467-019-10848-z |
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