A robust lifetime prediction method for photocouplers considering bias-deviation point for accelerated lifetime testing data

Photocouplers provide electrical isolation in critical systems, and accurate lifetime prediction is essential for maintaining operational safety. Conventional approaches rely on accelerated lifetime testing (ALT) and predefined degradation models to estimate lifespan under normal conditions. However...

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Autors principals:	Yong Hun Park, Joon Ha Jung, Sang Chul Park, Jung Hwan Kim, Chang Hwoi Kim
Format:	Artigo
Idioma:	Inglês
Publicat:	Elsevier 2026-07-01
Col·lecció:	Nuclear Engineering and Technology
Matèries:	Photocouplers Lifetime prediction Bias-deviation point Accelerated lifetime test Monte-carlo dropout based deep learning
Accés en línia:	http://www.sciencedirect.com/science/article/pii/S1738573326001725
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