Uncovering selective excitations using the resonant profile of indirect inelastic x-ray scattering in correlated materials: observing two-magnon scattering and relation to the dynamical structure factor
Resonant inelastic x-ray scattering (RIXS) is a spectroscopic technique that has been widely used to study various elementary excitations in correlated and other condensed matter systems. For strongly correlated materials, besides boosting the overall signal the dependence of the resonant profile on...
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| Auteurs principaux: | , , , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
IOP Publishing
2012-01-01
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| Collection: | New Journal of Physics |
| Accès en ligne: | https://doi.org/10.1088/1367-2630/14/11/113038 |
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