Defective Wheat Kernel Recognition Using EfficientNet with Attention Mechanism and Multi-Binary Classification

As a globally significant food crop, the assessment of wheat quality is essential for ensuring food security and enhancing the processing quality of agricultural products. Conventional methods for assessing wheat kernel quality are often inefficient and markedly subjective, which hampers their abili...

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Bibliografiset tiedot

Päätekijät:	Duolin Wang, Jizhong Li, Han Gong, Jianyi Chen
Aineistotyyppi:	Artigo
Kieli:	Inglês
Julkaistu:	MDPI AG 2026-01-01
Sarja:	Applied Sciences
Aiheet:	EfficientNet attention mechanism deep learning wheat kernel quality detection
Linkit:	https://www.mdpi.com/2076-3417/16/3/1247
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