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Langmuir Probe Diagnostics with Optical Emission Spectrometry (OES) for Coaxial Line Microwave Plasma

The Langmuir probe is a feasible method to measure plasma parameters. However, as the reaction progresses in the discharged plasma, the contamination would be attached to the probe surface and lead to a higher incorrect electron temperature. Then, the electron density cannot be obtained. This paper...

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Autores principales: Chi Chen, Wenjie Fu, Chaoyang Zhang, Dun Lu, Meng Han, Yang Yan
Formato: Artigo
Lenguaje:Inglês
Publicado: MDPI AG 2020-11-01
Colección:Applied Sciences
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Acceso en línea:https://www.mdpi.com/2076-3417/10/22/8117
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