Kubelka-Munk function, Urbach energy and Kramer–Kronig method in porous silicon
Porous silicon (PS) samples were fabricated using electrochemical etching and characterized by atomic force microscopy, which showed that the surface roughness increases with porosity. The optical properties and the influence of porosity were investigated through specular and diffuse reflectance, t...
Αποθηκεύτηκε σε:
| Κύριος συγγραφέας: | |
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| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
Al-Farabi Kazakh National University
2025-12-01
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| Σειρά: | Physical Sciences and Technology |
| Διαθέσιμο Online: | https://phst.kaznu.kz/index.php/journal/article/view/486 |
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