Successive gamma-ray irradiation and corresponding post-irradiation annealing of pMOS dosimeters
The paper investigates a possibility of pMOS dosimeter re-use for the measurement of gamma-ray irradiation. The dosimeters were irradiated to the dose of 35 Gy, annealed at room and elevated temperatures, after which they were irradiated again to the same dose value. Changes in the threshold vol...
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| Hlavní autoři: | , , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
VINCA Institute of Nuclear Sciences
2012-01-01
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| Edice: | Nuclear Technology and Radiation Protection |
| Témata: | |
| On-line přístup: | http://www.doiserbia.nb.rs/img/doi/1451-3994/2012/1451-39941204341P.pdf |
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