High-resolution electron time-of-flight spectrometers for angle-resolved measurements at the SQS Instrument at the European XFEL

A set of electron time-of-flight spectrometers for high-resolution angle-resolved spectroscopy was developed for the Small Quantum Systems (SQS) instrument at the SASE3 soft X-ray branch of the European XFEL. The resolving power of this spectrometer design is demonstrated to exceed 10 000 (E/ΔE), us...

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Detalhes bibliográficos

Principais autores:	Alberto De Fanis, Markus Ilchen, Alexander Achner, Thomas M. Baumann, Rebecca Boll, Jens Buck, Cyril Danilevsky, Sergey Esenov, Benjamin Erk, Patrik Grychtol, Gregor Hartmann, Jia Liu, Tommaso Mazza, Jacobo Montaño, Valerija Music, Yevheniy Ovcharenko, Nils Rennhack, Daniel Rivas, Daniel Rolles, Philipp Schmidt, Hamed Sotoudi Namin, Frank Scholz, Jens Viefhaus, Peter Walter, Pawel Ziółkowski, Haiou Zhang, Michael Meyer
Formato:	Artigo
Idioma:	Inglês
Publicado em:	International Union of Crystallography 2022-05-01
coleção:	Journal of Synchrotron Radiation
Assuntos:	time-of-flight spectrometer electron spectroscopy fel synchrotron
Acesso em linha:	http://scripts.iucr.org/cgi-bin/paper?S1600577522002284
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