Porous silicon prepared by photo electrochemical etching assisted by laser
Porous silicon (PS) layers are prepared by anodization for different etching current densities. The samples are then characterized the nanocrystalline porous silicon layer by X-Ray Diffraction (XRD), Atomic Force Microscopy (AFM), Fourier Transform Infrared (FTIR). PS layers were formed on n-type S...
保存先:
| 第一著者: | |
|---|---|
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
University of Baghdad
2019-01-01
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| シリーズ: | Iraqi Journal of Physics |
| 主題: | |
| オンライン･アクセス: | https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/162 |
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