Random Illumination Microscopy: faster, thicker, and aberration-insensitive
Abstract The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.
שמור ב:
| Principais autores: | , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Nature Publishing Group
2025-01-01
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| סדרה: | Light: Science & Applications |
| גישה מקוונת: | https://doi.org/10.1038/s41377-024-01687-9 |
| תגים: |
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