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Beyond accuracy: Quantifying the reliability of multiple instance learning for whole slide image classification.

Machine learning models have become integral to many fields, but their reliability, defined as producing dependable, trustworthy, and domain-consistent predictions, remains a critical concern. Multiple Instance Learning (MIL) models designed for Whole Slide Image (WSI) classification in computationa...

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Hlavní autoři: Hassan Keshvarikhojasteh, Marc Aubreville, Christof A Bertram, Josien P W Pluim, Mitko Veta
Médium: Artigo
Jazyk:Inglês
Vydáno: Public Library of Science (PLoS) 2025-01-01
Edice:PLoS ONE
On-line přístup:https://doi.org/10.1371/journal.pone.0337261
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