Deciphering key genomic regions controlling flag leaf size in wheat via integration of meta-QTL and in silico transcriptome assessment

Abstract Background Grain yield is a complex and polygenic trait influenced by the photosynthetic source-sink relationship in wheat. The top three leaves, especially the flag leaf, are considered the major sources of photo-assimilates accumulated in the grain. Determination of significant genomic re...

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Dades bibliogràfiques

Autors principals:	Binxue Kong, Jingfu Ma, Peipei Zhang, Tao Chen, Yuan Liu, Zhuo Che, Fahimeh Shahinnia, Delong Yang
Format:	Artigo
Idioma:	Inglês
Publicat:	BMC 2023-01-01
Col·lecció:	BMC Genomics
Matèries:	Wheat Flag leaf traits QTL mapping Meta-analysis Transcriptome Candidate genes
Accés en línia:	https://doi.org/10.1186/s12864-023-09119-5
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