In-Plane Liftout and Push-to-Pull for In Situ Mechanical Testing of Irradiated Inconel X-750

A streamlined sample preparation method for nanomechanical testing is needed to improve the quality of specimens, reduce the cost, and increase the versatility of specimen fabrication. This work outlines an in-plane liftout focused ion beam (FIB) fabrication procedure to prepare electron-transparent...

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Hauptverfasser:	Lucia R. Gomez-Hurtado, Tiankai Yao, Fei Teng, Mario D. Matos, Laura Hawkins, Ge Yang, Yachun Wang
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	MDPI AG 2024-08-01
Schriftenreihe:	Energies
Schlagworte:	X-750 in-plane liftout in situ mechanical testing transmission electron microscopy (TEM) focused ion beam (FIB) push-to-pull (PTP)
Online-Zugang:	https://www.mdpi.com/1996-1073/17/17/4199
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In-Plane Liftout and Push-to-Pull for In Situ Mechanical Testing of Irradiated Inconel X-750

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