Synergistic effect of total ionizing dose and single-event upset in the analog/digital converter AD574
This study investigates the AD574, a 12-bit analog/digital converter (ADC) produced by American Analog Devices, Inc. (ADI) using bipolar/I2L technology. The test samples are subjected to a total ionizing dose (TID) of 400 Gy(Si) under 60Co γ irradiation. The samples with and without the TID are then...
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| Principais autores: | , , , , , , , , , , |
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| Format: | Artigo |
| Sprog: | Chinês |
| Udgivet: |
Science Press
2021-08-01
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| Serier: | Fushe yanjiu yu fushe gongyi xuebao |
| Fag: | |
| Online adgang: | http://www.fs.sinap.ac.cn/thesisDetails#10.11889/j.1000-3436.2021.rrj.39.040702&lang=zh |
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