Accurate Inner Profile Measurement of a High Aspect Ratio Aspheric Workpiece Using a Two-Probe Measuring System
This paper presents a novel method for inner profile measurement and geometric parameter evaluation, such as the radius of the bottom, steepness and straightness of the steep sidewall of a high aspect ratio aspheric workpiece, by utilizing a two-probe measuring system, which includes a lateral displ...
שמור ב:
| Principais autores: | , , , , |
|---|---|
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
MDPI AG
2022-06-01
|
| סדרה: | Applied Sciences |
| נושאים: | |
| גישה מקוונת: | https://www.mdpi.com/2076-3417/12/13/6628 |
| תגים: |
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
|