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Microstructure and Properties of Electromigration of Sn58Bi/Cu Solder Joints with Different Joule Thermal Properties

Electromigration is one of the most important research issues affecting the reliability of solder joints. Current-induced Joule heating affects the electromigration behavior of solder joints. Solder joints with different cross-sectional areas were designed to obtain different Joule heating propertie...

תיאור מלא

שמור ב:
מידע ביבליוגרפי
Principais autores: Yijie Gao, Keke Zhang, Chao Zhang, Yuming Wang, Weiming Chen
פורמט: Artigo
שפה:Inglês
יצא לאור: MDPI AG 2023-08-01
סדרה:Metals
נושאים:
גישה מקוונת:https://www.mdpi.com/2075-4701/13/8/1475
תגים: הוספת תג
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