Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry

Cantilever devices have found applications in numerous scientific fields and instruments, including the atomic force microscope (AFM), and as sensors to detect a wide range of chemical and biological species. The mechanical properties, in particular, the spring constant of these devices is crucial w...

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Hlavní autoři:	Ashley D. Slattery, Adam J. Blanch, Cameron J. Shearer, Andrew J. Stapleton, Renee V. Goreham, Sarah L. Harmer, Jamie S. Quinton, Christopher T. Gibson
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	MDPI AG 2019-06-01
Edice:	Applied Sciences
Témata:	trapezoidal cantilever atomic force microscopy spring constant calibration
On-line přístup:	https://www.mdpi.com/2076-3417/9/13/2604
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