Surface photovoltage characterisation of metal halide perovskite on crystalline silicon using Kelvin probe force microscopy and metal-insulator-semiconductor configuration

In this study we analysed halide perovskite films deposited directly on crystalline silicon by means of two set-ups using different operating modes of the surface photovoltage (SPV) methods, i.e., the Kelvin probe force microscopy (KPFM) and the metal-insulator-semiconductor (MIS) technique. The KPF...

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主要な著者:	Bojar Aleksandra, Regaldo Davide, Alvarez José, Alamarguy David, Donchev Vesselin, Georgiev Stefan, Schulz Philip, Kleider Jean-Paul
フォーマット:	Artigo
言語:	Inglês
出版事項:	EDP Sciences 2022-01-01
シリーズ:	EPJ Photovoltaics
主題:	surface photovoltage kelvin probe force microscopy metal halide perovskites metal-insulator-semiconductor
オンライン･アクセス:	https://www.epj-pv.org/articles/epjpv/full_html/2022/01/pv220017/pv220017.html
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