A Probabilistic Physico-Chemical Diffusion Model of the Key Drifting Parameter of Measuring Equipment
(1) Background: A new probabilistic physico-chemical model of the drifting key parameter of measuring equipment is proposed. The model allows for the integrated consideration of degradation processes (electrolytic corrosion, oxidation, plastic accumulation of dislocations, etc.) in nodes and element...
Guardat en:
| Autor principal: | |
|---|---|
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI AG
2024-01-01
|
| Col·lecció: | Axioms |
| Matèries: | |
| Accés en línia: | https://www.mdpi.com/2075-1680/13/1/41 |
| Etiquetes: |
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|