Deep Convolutional Neural Network Optimization for Defect Detection in Fabric Inspection

This research is aimed to detect defects on the surface of the fabric and deep learning model optimization. Since defect detection cannot effectively solve the fabric with complex background by image processing, this research uses deep learning to identify defects. However, the current network archi...

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Hlavní autoři:	Chao-Ching Ho, Wei-Chi Chou, Eugene Su
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	MDPI AG 2021-10-01
Edice:	Sensors
Témata:	deep convolutional neural network defect detection machine vision embedded inspection deep learning network optimization pruning parameter
On-line přístup:	https://www.mdpi.com/1424-8220/21/21/7074
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