Phase-Shifting Projected Fringe Profilometry Using Binary-Encoded Patterns
A phase unwrapping method for phase-shifting projected fringe profilometry is presented. It did not require additional projections to identify the fringe orders. The pattern used for the phase extraction could be used for phase unwrapping directly. By spatially encoding the fringe patterns that were...
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| Hoofdauteurs: | , |
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| Formaat: | Artigo |
| Taal: | Inglês |
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MDPI AG
2021-08-01
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| Reeks: | Photonics |
| Onderwerpen: | |
| Online toegang: | https://www.mdpi.com/2304-6732/8/9/362 |
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