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Formal Specification Based Automatic Test Generation for Embedded Network Systems

Embedded systems have become increasingly connected and communicate with each other, forming large-scaled and complicated network systems. To make their design and testing more reliable and robust, this paper proposes a formal specification language called SENS and a SENS-based automatic test genera...

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Autors principals: Eun Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, Hitoshi Ohsaki
Format: Artigo
Idioma:Inglês
Publicat: Wiley 2014-01-01
Col·lecció:Journal of Applied Mathematics
Accés en línia:http://dx.doi.org/10.1155/2014/909762
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