Fluence Dependence of Surface Morphology and Deuterium Retention in W Bulks and Nanocrystalline W Films Exposed to Deuterium Plasma
The surface morphology of pure W bulks and nanocrystalline tungsten films was investigated after exposure to a low-energy (100 eV/D), high-flux (1.8 × 10<sup>21</sup> D·m<sup>−2</sup>s<sup>−1</sup>) deuterium plasma. Nanocrystalline tungsten films of 6 μm thickness were deposited on tungsten bulks a...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI AG
2021-02-01
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| Edice: | Applied Sciences |
| Témata: | |
| On-line přístup: | https://www.mdpi.com/2076-3417/11/4/1619 |
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