Justification of Scanning Contact Potentiometry Applicability to Test NPP Equipment during its Manufacture
The method of scanning contact potentiometry (SCP) was investigated in factory conditions and functional capabilities of electric non-destructive testing (NDT) method to detect structural heterogeneities and technological defects were demonstrated directly in the process of reactor equipment product...
I tiakina i:
| Ngā kaituhi matua: | , , , , , |
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| Hōputu: | Artigo |
| Reo: | Inglês |
| I whakaputaina: |
Национальный исследовательский ядерный университет МИФИ
2023-04-01
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| Rangatū: | Глобальная ядерная безопасность |
| Ngā marau: | |
| Urunga tuihono: | https://glonucsec.elpub.ru/jour/article/view/187 |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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