Optimizing Crop Yield Estimation through Geospatial Technology: A Comparative Analysis of a Semi-Physical Model, Crop Simulation, and Machine Learning Algorithms

This study underscores the critical importance of accurate crop yield information for national food security and export considerations, with a specific focus on wheat yield estimation at the Gram Panchayat (GP) level in Bareilly district, Uttar Pradesh, using technologies such as machine learning al...

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Autors principals:	Murali Krishna Gumma, Ramavenkata Mahesh Nukala, Pranay Panjala, Pavan Kumar Bellam, Snigdha Gajjala, Sunil Kumar Dubey, Vinay Kumar Sehgal, Ismail Mohammed, Kumara Charyulu Deevi
Format:	Artigo
Idioma:	Inglês
Publicat:	MDPI AG 2024-03-01
Col·lecció:	AgriEngineering
Matèries:	crop yield DSSAT ML algorithms
Accés en línia:	https://www.mdpi.com/2624-7402/6/1/45
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