A Bayesian Optimal Design for Accelerated Degradation Testing Based on the Inverse Gaussian Process

Accelerated degradation testing (ADT) is commonly used to obtain degradation data of products by exerting loads over usage conditions. Such data can be used for estimating component lifetime and reliability under usage conditions. The design of ADT entails to establish a model of the degradation pro...

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Autores principales:	Xiaoyang Li, Yuqing Hu, Enrico Zio, Rui Kang
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	IEEE 2017-01-01
Colección:	IEEE Access
Materias:	Accelerated degradation testing Bayesian optimal design inverse Gaussian process Markov chain Monte Carlo (MCMC) surface fitting
Acceso en línea:	https://ieeexplore.ieee.org/document/7882675/
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