Uncertainty Propagation in Curvature-Based Surface Form Metrology: A Monte Carlo and Differential Geometry Approach
Curvature-based descriptors are increasingly used in surface metrology for the characterization of complex geometries. However, their sensitivity to measurement uncertainty remains insufficiently understood, particularly in comparison with conventional deviation-based metrics. This study investigate...
I tiakina i:
| Ngā kaituhi matua: | , , |
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| Hōputu: | Artigo |
| Reo: | Inglês |
| I whakaputaina: |
MDPI AG
2026-06-01
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| Rangatū: | Metrology |
| Ngā marau: | |
| Urunga tuihono: | https://www.mdpi.com/2673-8244/6/2/43 |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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